Along with the increase of package density, the issue of ASIC thermal failure has become more and more important.
随着封装密度的进一步提高,其热失效问题也变得更加严重。
With increase in electronic package density, the reliability of a board-level package under drop impact load becomes a key issue.
随着微电子封装密度的提高,板级封装在跌落冲击载荷下的可靠性成为人们关注的焦点。
The reduction in size of components and circuits for increasing package density and reducing power dissipation and signal propagation delays.
减少元件和电路的几何尺寸,以达到增加电路的封装密度、减少功耗和减小信号传播延迟的目的。
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