不要去穿透式生活，通过生活成长。
光学显微镜和穿透式电子显微镜要求将材料切成更薄的片，或在仔细观察前将其控制在玻璃下。
Light microscopes and transmission electron microscopes require that materials be sliced thinly, or trapped under glass before being examined.
本发明涉及一种最佳化图像品质扫描的方法，可运用于穿透式与非穿透式扫描器中。
A scan method for optimizing image quality is disclosed, which can be used for transmission-type or non-transmission scanner.
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