这些log的分压都来自于,化学势对μ零加RTlogp的展开。

These log partial pressures all come from expanding out the chemical potential as mu naught plus RT log p.

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如果输入端的短路点具有很低的热电动势，用这种方法就可以验证输入噪声和零点随时间的漂移。

If the short circuit has a very low thermoelectric EMF, this can be used to verify input noise and zero drift with time.

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设计了一种新的软硬件相结合的方法去检测反电动势过零点。

Firstly, a new zero-crossing detection method with software comparing with hardware is designed.

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