缺陷是影响集成电路成品率与可靠性的主要因素。
The defect is a main factor of affecting IC's yield and reliability.
本文提出了一种基于数值积分的集成电路成品率估计方法。
A novel integration-based yield estimation method is developed for yield optimization of integrated circuits.
对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。
Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.
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