...仪器详情 电子探针简介：电子探针(EPMA)是用极细的电子束对样品表面进行照射产生特征性X射线，对特征性X射线进行分光和强度测定，得到微小区域的元素组成及样品表面元素...
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文章详细信息 关键词： 沸石岩;;矿物特征;;化学成分;;斜发沸石;;电子探针 [gap=789]Keywords: zeolite rock;mineralogical feature;chemical components;clinoptlolite;electron probe
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电子探针显微分析 EPMA ; Electron probe microanalysis ; E MPA
电子探针微区分析 EPMA ; [分化] electron probe micro-analysis
电子探针的电子操纵台 electron lperation desk of EPMA
电子探针显微分析仪 EPMA
扫描电子探针 scanning electron microprobe
电子探针微量分析 EPMA ; [分化] electron probe microanalysis
电子探针微量分析器 EPMA ; electron probe micro analyser
电子探针分析 EMPA ; EPX ; electron microprobe analysis ; [分化] electron probe analysis
电子探针显微照片 electronprobemicrograph
The microsmicture, phase,elemen distribution and microhardness have been analyzed wth the aid ofmicroscope, X-ray diffraction, electron probe and microhardness-tester.
借助光学显微镜、X射线衍射仪、电子探针及显微硬度计等手段对熔覆层的组织、物相、元素分布和显微硬度分布特征进行了分析研究。
参考来源 - 激光熔覆镍基金属陶瓷涂层的研究Electron microprobe analysis(EMP) of these coatings on the surface of specimens indicated that the proportion of cerium in the total amounts of cerium and zinc increased with the increase of the exposure time.
电子探针分析表明转化膜中铈和锌的含量随着浸泡时间的延长而增加。
参考来源 - 锌合金防腐蚀稀土表面改性的研究If mineral morphological characteristics identification could be combined with electron probe analysis,it will be a easier and more reliable judging method with lower cost.
如果根据显微镜下矿物形态特征鉴定与选择性的电子探针分析相互验证,将是一种既经济又简单、而且更可靠的判别方法。
参考来源 - 与金刚石原生矿有关的铬尖晶石形态特征From the analysis of the damage morphology and element change of the material surface with an electronic probe microanalyzer, we found that GaAs would decompound under high temperature, As vaporized from the surface, Ga and its oxid left behind.2.
利用电子探针观察材料表面的损伤形貌并进行组分分析，发现高温下砷化镓发生分解氧化，砷原子蒸发，表面剩余金属镓以及镓的氧化物。
参考来源 - 强激光对砷化镓材料损伤机理的研究·2,447,543篇论文数据，部分数据来源于NoteExpress
本文介绍了电子探针过程计算机更新所涉及的硬件和软件方面的工作。
This paper introduces the work about the hardware and the software in renewing the process computer for the EPMA (Electronic Probe Microanalyzer).
扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。
Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.
通过电子探针微区分析和霍尔效应法探测锗杂质及其相关施主和受主浓度的变化。
Electron probe microanalyses and Hall effect were used to measure the variations of Ge dopant and its related donor and acceptor concentrations.
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