通过电子探针微区分析和霍尔效应法探测锗杂质及其相关施主和受主浓度的变化。
Electron probe microanalyses and Hall effect were used to measure the variations of Ge dopant and its related donor and acceptor concentrations.
方法应用电子探针微区分析(EPMA)技术对初期釉质龋中化学成分的空间分布进行选定微区、线扫描及面扫描分析。
Methods the spatial distribution of the compositional elements in incipient enamel caries was obtained by spot selection, line and map analyses with electron probe microanalysis technique (EPMA).
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