报表基底上元素的事件序列显示了相关的位置。
The event firing sequence of the elements on the report base shows the elements relative position.
黄色基底的呈现元素以探索和玩耍。
为了弥补目前采用的各种镀层厚度测量方法之不足，本文提出利用镀层元素一次X光激发的基底金属二次荧光进行膜厚测量的设想，并推导出相应的计算公式。
A suggestion was made to measure thin-film thicknesses using second X-ray fluorescence from substrate excited by primary X-ray of plating element, and corresponding equations were derived.
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