报表基底上元素的事件序列显示了相关的位置。
The event firing sequence of the elements on the report base shows the elements relative position.
黄色基底的呈现元素以探索和玩耍。
为了弥补目前采用的各种镀层厚度测量方法之不足，本文提出利用镀层元素一次X光激发的基底金属二次荧光进行膜厚测量的设想，并推导出相应的计算公式。
A suggestion was made to measure thin-film thicknesses using second X-ray fluorescence from substrate excited by primary X-ray of plating element, and corresponding equations were derived.
在紧密的具型别阵列中，其大小是固定的，元素的型别必须和阵列的基底型别相同。
In typed arrays, which are dense, the size is fixed, and elements must be the same type as the base type of the array.
在紧密的具型别阵列中，其大小是固定的，元素的型别必须和阵列的基底型别相同。
In typed arrays, which are dense, the size is fixed, and elements must be the same type as the base type of the array.
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