This dissertation aims at discussing the model, simulation and optimization methods of functional yield of integrated circuits.
本文对集成电路功能成品率模型、仿真技术以及功能成品率优化设计方法进行了系统研究。
参考来源 - 集成电路功能成品率仿真与优化技术研究·2,447,543篇论文数据，部分数据来源于NoteExpress
研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。
Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.
对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。
Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.
应用推荐