研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。

Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.

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对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。

Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.

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对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。

Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.

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