fission yield analysis 裂变产额分析
crop yield analysis 作物产量分析
dynamic yield analysis 产量动态分析
combined yield analysis 产量组合分析
restriction endonuclease digestion yield analysis 限制性酶切片段分析
yield-map analysis 产量图分析
Yield effect analysis 增产效应分析
Yield component analysis 产量成因分析
Internal and outsource wafer sort/final test support, abnormal yield analysis.
中测、成测生产线支持,成品率异常分析。
Experimental result shows that the verification process of yield analysis chip is right and stable.
实验结果证明,成品率分析芯片验证流程具有正确性和稳定性。
Experience example demonstrates that the proposed method is very useful in yield analysis of electronic circuit design.
算例表明,该方法对电路设计进行快速成品率分析及电路的稳定性设计具有较好的应用前景。
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