Product yield analysis, bad product analysis;
产品良率分析、不良产品分析；
Internal and outsource wafer sort/final test support, abnormal yield analysis.
中测、成测生产线支持，成品率异常分析。
Experimental result shows that the verification process of yield analysis chip is right and stable.
实验结果证明，成品率分析芯片验证流程具有正确性和稳定性。
Experimental result shows that the verification process of yield analysis chip is right and stable.
实验结果证明，成品率分析芯片验证流程具有正确性和稳定性。
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