xrd x ray diffraction x射线衍射分析
x-ray diffraction xrd x射线衍射
x ray diffraction xrd x射线衍射
x-ray diffractometry xrd x射线衍射
x ray diffractometry xrd x射线衍射
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
The surface profiles, micro-morphologies and crystal quality of SSP ribbon and Poly-Si film were then investigated by the step profiler, XRD (X-ray Diffraction) and SEM (Scanning Electron Microscopy).
借助台阶仪、X射线衍射(XRD)、扫描电镜(sem)等手段对颗粒硅带及多晶硅薄膜进行了表面轮廓、结晶质量和微观形貌的表征。
The microstructure, the surface atoms and the average manganese valence were investigated by XRD, X-ray photoelectron spectrum(XPS)and spectrophotometric method with potassium permanganate.
利用X射线衍射、X射线光电子能谱和高锰酸钾分光光度法，对铁氧体粉末的微观结构、表面原子信息和锰的平均价态进行了研究。
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