x ray diffraction xrd x射线衍射
x-ray diffraction xrd spectrum x射线衍射谱
x-ray powder diffraction xrd x射线粉末衍射
x-ray diffraction technique xrd x射线衍射技术
xrd x ray diffraction x射线衍射分析
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact Angle measurements.
用扫描电镜、透射电镜、X射线衍射、接触角测量等技术对表面进行了表征。
Scanning electron microscope (SEM) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure and the distribution of diamond grain in the film.
用扫描电镜(sem)和X射线衍射(XRD)方法检测了复合膜的表面形貌、晶体显微结构和复合膜中金刚石颗粒的分布情况。
The phase structure and microstructure of samples under different heating rates were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM) etc.
用X射线衍射仪（XRD）以及扫描电镜（SEM）等研究了试样在不同预设升温速度下的相结构和显微组织。
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