metal tip probe 金属尖探针
probe tip 探头端部 ; 探头端 ; 探针
probe tip nut driver 探头极尖螺帽旋管
probe tip diameter 探头顶端直径
probe tip length 探头顶端长度
dual-tip conductivity probe 双探针电导探头
Tip of Probe 探针针尖
optical probe tip 光学探针
Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端,然后检测电流变化。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面,能得到高分辨率的影像(约5纳米的分辨率)。
We show the physical pictures about the interaction between the probe tip and sample and photon tunneling effect in PSTM.
给出了PSTM中探针针尖与样品相互作用和光子隧穿的物理图像。
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