Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端,然后检测电流变化。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面,能得到高分辨率的影像(约5纳米的分辨率)。
The frequency responses of the system combing probe tip and piezo chip were detected, the difference between the shear force detection and the tapping mode detection was discussed.
文中给出了探针-压电片检测系统的的频率特性,并比较了剪切力探测和轻敲模式探测特性的区别。
应用推荐