New Test Patterns 新的测试模式
test patterns generation 测试图形生成
microelectronic test patterns 微电子测试图形
Test patterns for micrography 缩微照相用测试图形卡
HDR Clipping Test Patterns HDR 削锋测试图
test patterns applied by circuit-under-test 电路自己施加测试矢量
A test pattern generator based on CUT's feedback is realized.
本文实现了一种基于自反馈的测试向量产生方法，采用只增加反馈线的方式来对集成电路进行测试。
参考来源 - 时延故障测试产生算法与I·2,447,543篇论文数据，部分数据来源于NoteExpress
以上来源于: WordNet
N a complex pattern used to test the characteristics of a television transmission system (电视图像)测试卡
Congratulations! You have successfully created a local broker ready to test patterns.
祝贺您！您已经成功创建了一个可用于测试模式的本地代理。
Because this method doesn't use memory to store the test patterns, it can save certain area of the chip.
该方法由于没有采用存储器存储测试模板，所以可以节省一定的芯片面积。
The test suite is made up of test cases, based on one of two available test patterns: operation-level testing or scenario based testing.
测试套件由测试用例构成，并基于以下两种可用的测试模式之一：操作级别的测试或基于场景的测试。
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