Semiconductor testing device 发明名称
discrete semiconductor testing 分立器件测试
12 semiconductor Testing House 寸半导体测试厂
Semiconductor Testing and Equipments 半导体检测与设备
discrete semiconductor testing systems 半导体分立器件测试系统
Semiconductor Memory Testing 半导体记忆体测试
Testing of semiconductor materials 半导体工艺材料的检验
Semiconductor Laser Testing System 半导体激光测试系统
Penny Zhang, General Manager, Shanghai Still Semiconductor Testing co., Ltd.
张宛平，总经理，上海依然半导体测试有限公司。
The semiconductor testing system makes full use of the high-powered ARM microprocessor S3C44B0. It is testified that the system can meet the requirement of function.
该系统充分发挥了S3C44B0嵌入式微处理器高性能优势，经调试证明，能够可靠地实现对半导体分立器件的参数测试和分选的功能。
The method of testing semiconductor RAM in processes on-line condition is highly different from conventional pattern sensitive method.
联机工作情况下对半导体随机存贮器的故障检测和诊断与一般的图案敏化法有显著的不同。
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