The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
The dynamic measurement characteristics of a novel wavelength scanning interferometer for absolute distance measurement are analyzed in terms of theory.
对用于距离绝对测量的波长扫描干涉法的动态测量特性进行了分析。
In this thesis, a technique of scanning white-light interferometer in Michelson configuration is employed to measure and analyze the characteristics of different types of oil-film on water surface.
本文基于迈克尔逊干涉原理，通过扫描白光干涉装置对不同油品在水面形成的油膜的特性进行了测量和分析。
应用推荐