The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
The dynamic measurement characteristics of a novel wavelength scanning interferometer for absolute distance measurement are analyzed in terms of theory.
对用于距离绝对测量的波长扫描干涉法的动态测量特性进行了分析。
The dynamic measurement characteristics of a novel wavelength scanning interferometer for absolute distance measurement are analyzed in terms of theory.
对用于距离绝对测量的波长扫描干涉法的动态测量特性进行了分析。
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