x-ray diffraction xrd x射线衍射
x ray diffraction xrd x射线衍射
x-ray diffraction xrd spectrum x射线衍射谱
x-ray powder diffraction xrd x射线粉末衍射
x-ray diffraction technique xrd x射线衍射技术
xrd x ray diffraction x射线衍射分析
X ray Diffraction (XRD) was employed to determine the phases presented in the modified layer.
利用X射线衍射(XRD)分析表面改性层结构的变化。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
The structure and component of coating were analyzed by FTIR spectra, X ray diffraction (XRD) and transmission electron microscopy (TEM).
采用红外光谱、X射线衍射和透射电镜对涂层的组成和结构进行了分析。
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