AOI partial scan 感兴趣区域
area-optimized partial scan 面积优化部分扫描
partial-scan 部分扫描
Partial range scan 局部范围扫描
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Quick scan, deep scan and partial scan feature gives you full recovery.
快速扫描，深度扫描和部分扫描功能为您提供完全恢复。
A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.
提出了一种在内建自测试(BIST)中进行部分扫描的算法，此算法综合了电路的结构分析和可测性分析。
An integrated circuit is described as comprising a plurality of logic elements (LEs), each of which having a plurality of outputs, and a partial scan register.
一种集成电路，包括多个逻辑元件(LE)和一个部分扫描寄存器，每个逻辑元件具有多个输出。
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