Partial Scan 部分扫描
AOI partial scan 感兴趣区域
area-optimized partial scan 面积优化部分扫描
Partial range scan 局部范围扫描
·2,447,543篇论文数据，部分数据来源于NoteExpress
A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.
提出了一种在内建自测试(BIST)中进行部分扫描的算法，此算法综合了电路的结构分析和可测性分析。
An integrated circuit is described as comprising a plurality of logic elements (LEs), each of which having a plurality of outputs, and a partial scan register.
一种集成电路，包括多个逻辑元件(LE)和一个部分扫描寄存器，每个逻辑元件具有多个输出。
Fault injection emulation platform based on Joint Test Action Group (JTAG) boundary scan and dynamic partial reconfiguration is proposed.
提出基于JTAG边界扫描技术和动态局部重配置的错误注入模拟平台。
应用推荐