We propose a new approach of functional testing for microprocessor systems and discuss the hardware associated and test generation.
针对微处理器系统测试问题,提出了一种全新的功能测试方法。
Today, multiprocessor systems are cheap and plentiful, nearly every major microprocessor has built-in support for multiprocessing, and many support dozens or hundreds of processors.
现在,多处理器系统很便宜,而且数量很多,几乎每个主要微处理器都内置了多处理支持,其中许多系统支持数十个或数百个处理器。
Medium scale embedded systems are supported by 16 and 32 bit microcontroller or microprocessor and they help to reduce size, cost and power consumption of the systems.
中型嵌入式系统主要是16位和32位微控制器或微处理器,它们有助于减少尺寸、成本和系统功耗。
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