We propose a new approach of functional testing for microprocessor systems and discuss the hardware associated and test generation.
针对微处理器系统测试问题，提出了一种全新的功能测试方法。
We propose a new approach of functional testing for microprocessor systems and discuss the hardware associated and test generation.
针对微处理器系统测试问题，提出了一种全新的功能测试方法。
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