...》2009年硕士论文 击高定向石墨(Highly Oriented Pyrolytic Graphite,HOPG)样品,通过扫描隧道显微镜(Scanning Tunnel Microscope,STM)观测样品表面产生的纳米缺陷,对这些纳米缺陷尺寸进行统计得出每种离子产生的纳米丘直径和高度的平均值。
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通过这些观察方法的比较发现扫描隧道显微镜可以提供更加详细、精确的三维参数。
Among these methods, STM can provide more detailed and accurate three dimensional parameters of the microstructure.
通过光学显微镜(OM)，扫描电镜(SEM)和扫描隧道显微镜(STM)观察了光记录有机薄膜的微区结构。
In this paper, optical microscopy (OM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM) are used to investigate the microstructure of recorded organic thin film.
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