通过这些观察方法的比较发现扫描隧道显微镜可以提供更加详细、精确的三维参数。
Among these methods, STM can provide more detailed and accurate three dimensional parameters of the microstructure.
通过光学显微镜(OM)，扫描电镜(SEM)和扫描隧道显微镜(STM)观察了光记录有机薄膜的微区结构。
In this paper, optical microscopy (OM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM) are used to investigate the microstructure of recorded organic thin film.
通过光学显微镜(OM)，扫描电镜(SEM)和扫描隧道显微镜(STM)观察了光记录有机薄膜的微区结构。
In this paper, optical microscopy (OM), scanning electron microscopy (SEM) and scanning tunneling microscopy (STM) are used to investigate the microstructure of recorded organic thin film.
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