Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
The heated oxidation film of U-Nb alloy is studied by auger electron spectroscopy (AES) at different temperature in the high vacuum chamber.
用俄歇电子能谱（AES）研究了高真空下，环境温度对铀铌合金真空氧化膜的影响。
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