Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.

用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。

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The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).

采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。

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The initial oxidation of pure iron and implanted samples which were overlapped energy ion–implanted with C ions was studied by auger electron spectroscopy (AES).

用俄歇电子能谱 （AES） 研究高真空室中纯铁和多能量叠加注碳纯铁表面与氧气吸附及初始氧化过程。

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