用四圆衍射仪测定了晶体结构。
The crystal structure was determined with four-circle diffractometer.
用X衍射仪测定了点火后的生成物。
The products after ignition were examined through X-ray diffractometer.
用X射线单晶衍射仪测定了它的晶体结构。
The crystal structure was determined by X-ray diffraction method.
讨论了使用普通衍射仪进行小角散射的可能性。
The possibility of carrying out small Angle scattering with a common diffract apparatus has been discussed.
本文叙述了使用X射线衍射仪法测量宏观应力的原理。
The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper.
用X-射线衍射仪研究了蒙脱土在聚丙烯中的插层情况；
The intercalation of montmorillonite in the PP matrix was examined by X- ray diffraction method.
采用X-射线衍射仪对颗粒态抗性淀粉的结晶性质进行了研究。
The crystalline property of granular resistant starch(RS) was studied by X-ray diffractometer.
低能电子衍射仪(LEED)是研究单晶表面结构的有效工具。
LEED is an effective instrument for the study of surface structures of single-crystals.
用强功率四圆单晶衍射仪精确地修正了氟碳铈矿和氟铈矿的晶体结构。
The crystal structures of bastnaesite-(Ce) and fluocerite-(Ce) was refined by high power four-circle X-ray diffractometer.
用X射线双晶衍射仪扫描并分析了典型双势垒RTD样品的衍射摇摆曲线；
The results of double crystal X, ray diffraction measure of typical double barrier RTD material were given.
用X射线衍射仪检测了样品的结构，测量了样品的阻抗谱和电子顺磁共振谱。
The structures of the samples were analyzed by X-ray diffraction, and the impedance spectra and electron paramagnetic resonance spectra were measured.
介绍了岛津vd_1a型X射线衍射仪冷却循环水系统的故障分析及排除方法。
Analysis and removal of the troubles in cooling water system of VD_1A X_ray diffractometer were introduced in this paper with an example demonstration.
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
本文采用原子力显微镜和X射线粉末衍射仪研究了PVA溶液旋转涂膜的溶剂化效应。
The solvent effect on the preparation of PVA film by low speed spin machine was studied by using AFM and XRD.
用溶剂自然挥发法培养了五个单晶，并采用CCD 单晶衍射仪测定了它们的晶体结构。
Five crystal structures are determined by CCD diffractometer after the single crystals were grown by slow evaporation at room temperature.
对双晶衍射仪实行改造，用一台PC _ 401微机直接控制和进行小角散射等测量。
PC_401 computer system was introduced to the double crystal goniometer for small Angle scattering measurement.
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
本系统介绍了用微型计算机进行运行控制和信息采集及处理的三探头中子粉末衍射仪系统。
This paper introduces a neutron diffractometer system with three detectors in which the microcomputer is applied to control Instruments, collect information and process data.
利用光学显微镜、扫描电镜和X射线衍射仪研究了几种不同状态硅砖的晶体形貌和晶格常数。
The crystalline morphology and lattice constants of silica bricks in several status were investigated by the optic microscope, scanning electron microscope and X-ray diffraction.
利用光学显微镜、扫描电镜、显微硬度计及X射线衍射仪分析了高氮奥氏体的等温分解过程。
Employed by optical microscope, scanning electron microscope, microhardness tester and X ray diffraction instrument, the isothermal decomposition process of high nitrogen austenite was investigated.
介绍了X射线衍射仪在江苏油田石油地质、石油工程的应用以及对石油勘探和开发的地质意义。
This paper introduces X-ray diffractometer application of petroleum geology and petroleum project in Jiangsu oilfield, and geological meaning of petroleum exploration and production.
用X射线双晶衍射仪测量了阴极和玻璃热粘结工艺过程中阴极材料外延层和衬底的双晶回摆曲线。
Some double crystal rocking curves of photocathode epitaxy materials and substrates are measured by means of X-ray double crystal diffraction in the bonding process.
利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。
The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.
本文以三个故障实例详细地叙述了岛津vd—1a型X射线衍射仪高压系统的故障分析和排除方法。
In this paper the trouble shooting and is removal in high voltage system of Shimadzu VD-1A X-ray Diffractometer were described in detail. Three examples were demonstrated.
利用金相显微镜、X射线衍射仪、电子探针及滑动磨损试验机，研究了合金熔覆层的显微组织及性能。
The microstructure and properties of the composite coatings were investigated by optical microscopy, X-ray diffractometer, electron probe microanalyzer and a skimming wear machine.
介绍一种旧型号的X射线衍射仪微机化的升级改造技术以及相应的数据采集与分析系统(XRDS)。
In this paper, a micro-computerized upgrading method for old model X-ray diffractometer, as well as its data collection and analysis system (XRDS) are recommended.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
详细分析了x射线衍射仪结构，介绍了改造此类仪器的方法，包括计算机接口设计和软件编程、安装等。
Based on the detailed study on the structure of X ray diffractometer, an updated computer system, including computer interface, hardware and software, in general X ray diffractometer is developed.
采用金相显微镜、X射线衍射仪等分析测试手段，研究了锡对ZA62合金显微组织及力学性能的影响。
Effects of tin on the microstructure and mechanical properties of ZA62 alloys were investigated using optical microscopy, XRD analysis and tensile test.
应用推荐