用四圆衍射仪测定了晶体结构。
The crystal structure was determined with four-circle diffractometer.
用X衍射仪测定了点火后的生成物。
The products after ignition were examined through X-ray diffractometer.
讨论了使用普通衍射仪进行小角散射的可能性。
The possibility of carrying out small Angle scattering with a common diffract apparatus has been discussed.
用金相显微镜和X射线衍射仪分析涂层的显微组织。
The microstructure of the coating is analysed with metallographic microscope and X ray diffractometer.
本文叙述了使用X射线衍射仪法测量宏观应力的原理。
The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper.
介绍了一种用于X射线衍射仪的大功率高频高压电源。
The article explains a high-power high frequency and high voltage power supply which is used in X-ray Radial Diffraction instrument.
用X-射线衍射仪研究了蒙脱土在聚丙烯中的插层情况；
The intercalation of montmorillonite in the PP matrix was examined by X- ray diffraction method.
采用X-射线衍射仪对颗粒态抗性淀粉的结晶性质进行了研究。
The crystalline property of granular resistant starch(RS) was studied by X-ray diffractometer.
利用扫描电镜和X射线衍射仪分析了复合材料微观结构和组成成分的变化。
The microstructures and compositions of the composites were analyzed by scanning electron microscopy and X-ray diffractometer.
用X射线衍射仪检测了样品的结构，测量了样品的阻抗谱和电子顺磁共振谱。
The structures of the samples were analyzed by X-ray diffraction, and the impedance spectra and electron paramagnetic resonance spectra were measured.
介绍了岛津vd_1a型X射线衍射仪冷却循环水系统的故障分析及排除方法。
Analysis and removal of the troubles in cooling water system of VD_1A X_ray diffractometer were introduced in this paper with an example demonstration.
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
用扫描电镜、能谱仪和X射线衍射仪分别分析了涂层的形貌、化学成分和相组成。
The morphology, composition and structure of the coating were investigated by scanning electron microscopy, energy dispersive spectrometer and X-ray diffractometer.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
使用X射线衍射仪分析了产物的相结构，采用扫描电子显微镜观察了粉体颗粒形貌。
The phase and the microstructure of the products were analysed by X-ray diffractometer and scanning electron microscope.
本文采用原子力显微镜和X射线粉末衍射仪研究了PVA溶液旋转涂膜的溶剂化效应。
The solvent effect on the preparation of PVA film by low speed spin machine was studied by using AFM and XRD.
用溶剂自然挥发法培养了五个单晶，并采用CCD 单晶衍射仪测定了它们的晶体结构。
Five crystal structures are determined by CCD diffractometer after the single crystals were grown by slow evaporation at room temperature.
应用x射线能谱仪和x射线衍射仪分别对腐蚀产物及管表面宏观残余应力进行定量分析。
Quantitative analyses have been made on the composition of corroded products and the macro-residual stress on the pipe surface by EDX and XRD.
本系统介绍了用微型计算机进行运行控制和信息采集及处理的三探头中子粉末衍射仪系统。
This paper introduces a neutron diffractometer system with three detectors in which the microcomputer is applied to control Instruments, collect information and process data.
利用光学显微镜、扫描电镜和X射线衍射仪研究了几种不同状态硅砖的晶体形貌和晶格常数。
The crystalline morphology and lattice constants of silica bricks in several status were investigated by the optic microscope, scanning electron microscope and X-ray diffraction.
利用光学显微镜、扫描电镜、显微硬度计及X射线衍射仪分析了高氮奥氏体的等温分解过程。
Employed by optical microscope, scanning electron microscope, microhardness tester and X ray diffraction instrument, the isothermal decomposition process of high nitrogen austenite was investigated.
采用扫描电镜和X射线衍射仪分析了原始钨粉、炭化粉末和反应沉积物的显微组织和成分。
Scanning electron microscopy and X-ray diffraction were used to analyze the starting tungsten powder, the carburized tungsten powder and the deposit.
采用扫描电子显微镜、X -射线衍射仪、透射电子显微镜对产物的形貌和结构进行了表征。
Morphologies and structures of these products were characterized by means of scanning electron microscopy, X-ray diffraction, transmission electron microscopy.
利用x射线衍射仪、扫描电镜对试样进行物相和显微组织观察，并对原位反应机制进行了探讨。
The phase composition and microstructure of the test samples were analyzed by XRD and SEM. The in-situ reaction mechanism was discussed.
用X射线双晶衍射仪测量了阴极和玻璃热粘结工艺过程中阴极材料外延层和衬底的双晶回摆曲线。
Some double crystal rocking curves of photocathode epitaxy materials and substrates are measured by means of X-ray double crystal diffraction in the bonding process.
利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。
The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.
利用金相显微镜、X射线衍射仪、电子探针及滑动磨损试验机，研究了合金熔覆层的显微组织及性能。
The microstructure and properties of the composite coatings were investigated by optical microscopy, X-ray diffractometer, electron probe microanalyzer and a skimming wear machine.
介绍一种旧型号的X射线衍射仪微机化的升级改造技术以及相应的数据采集与分析系统(XRDS)。
In this paper, a micro-computerized upgrading method for old model X-ray diffractometer, as well as its data collection and analysis system (XRDS) are recommended.
介绍一种旧型号的X射线衍射仪微机化的升级改造技术以及相应的数据采集与分析系统(XRDS)。
In this paper, a micro-computerized upgrading method for old model X-ray diffractometer, as well as its data collection and analysis system (XRDS) are recommended.
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