讨论并比较了卢瑟福散射公式的几种推导方法，加深了对卢瑟福散射公式的理解。
This paper discusses and com pa res the methods of deriving the Rutherford scattering formula, and deepens our understanding of this formula.
甚至极少数发生大角度的散射，卢瑟福后来回忆说：“这是我一生中从未有的最难以置信的事，它好比你对一张纸发射出一发炮弹，结果被反弹回来而打到自己身上。”
A few even bounced straight back at the observer, which Rutherford said was as unexpected as firing a cannon shell at tissue paper and having it come back and hit you.
嗯，绪论，为了解释实验的结果,关于物质的alpha散射，卢瑟福说“,这儿有一个卢瑟福模型的脚注。
So, introduction, "in order to explain the results of experiments on scattering of alpha rays by matter, Professor Rutherford," and there is a footnote to the Rutherford model.
卢瑟福背散射分析结果表明，铁、氮两种原子的密度沿膜厚度方向呈梯度变化。
Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.
离子注入后进行了氧化试验，并结合X射线衍射和卢瑟福背散射进行了分析。
X ray diffraction and Rutherford Back Scattering techniques were adopted to investigate and analyze the oxidation characteristics of the films.
用卢瑟福背散射谱分析了稀土离子在多孔硅薄膜中的分布情况。
The distribution of rare earth ions embedded into porous silicon films was observed by Rutherford backscattering spectrometry.
用卢瑟福背散射、X 射线衍射和喇曼光谱法分析样品的成份及结构。
The structure and composition of samples were analysed by Rutherford backscattering spectroscopy (RBS), X-ray diffraction (XRD) and Raman spectra.
对卢瑟福背散射分析的基本原理作了概要的介绍。
The essential principle of Rutherford backscattering analysis is explained briefly.
本工作用卢瑟福背散射研究了离子束混合方法形成硅化钨的条件。
The conditions of forming tungsten silicide with As ion beam mixing have been studied by means of Rutherford backscattering.
本工作用卢瑟福背散射研究了离子束混合方法形成硅化钨的条件。
The conditions of forming tungsten silicide with As ion beam mixing have been studied by means of Rutherford backscattering.
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