The sources of the endemic fluorosis in Weixin, Zhaotong of Yunnan Province has been studied using an ion selective electrode(ISE) and X-ray diffraction analysis(XRD).
运用离子选择性电极（ISE）和X射线衍射分析（XRD）方法，对云南昭通威信地方病氟中毒区的氟源进行了研究。
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact Angle measurements.
用扫描电镜、透射电镜、X射线衍射、接触角测量等技术对表面进行了表征。
The structure, surface morphology and the optical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and photoluminescence (PL).
用X 射线衍射（XRD）、扫描电镜（SEM）、荧光光谱（PL）对样品进行结构、形貌和发光特性的分析。
Scanning electron microscope (SEM) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure and the distribution of diamond grain in the film.
用扫描电镜(sem)和X射线衍射(XRD)方法检测了复合膜的表面形貌、晶体显微结构和复合膜中金刚石颗粒的分布情况。
They were characterized by X-ray powder diffraction (XRD), transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM).
产物经x -射线粉末衍射(XRD)、透射电子显微镜(TEM)和高分辨电子显微镜(HRTEM)表征。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The phase structure and microstructure of samples under different heating rates were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM) etc.
用X射线衍射仪（XRD）以及扫描电镜（SEM）等研究了试样在不同预设升温速度下的相结构和显微组织。
METHODS: Study on the microstructure of Indigo Naturals with scanning electron microscope (SEM) and X ray diffractometer (XRD) were carried out.
方法：通过扫描电子显微镜(sem)和x衍射(XRD)方法，对青黛的微观结构进行了研究。
The influences of temperature, catalysts and moisture on microcrystallite structure of pyrolysis gasification semicoke were investigated using X-ray diffraction(XRD).
采用X-射线衍射（XRD）法分别考察了温度、催化剂和水分对生物质热解气化半焦微晶结构的影响。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
The microstructure of carbon fibers has been studied using X-ray diffractometer (XRD), transmission electron microscope (TEM) and high-resolution transmission electron microscope (HRTEM).
利用X射线衍射(XRD)、透射电子显微镜(TEM)、高分辨电子显微镜(H RTEM)研究了碳纤维的微观结构。
The sample's crystal phase, structure, morphology and the reaction process were characterized and analyzed by using X-ray diffraction(XRD), transmission electron microscopy(TEM).
采用X射线衍射（XRD）、透射电子显微镜（TEM）分析手段对样品的物相、结构、形貌进行了表征和分析。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
Analyzed the change of hydrate in autoclaved fly ash lime system with acid dissolve, X-ray Diffraction (XRD), Infrared Spectroscopy (IR) and Scanning Electron Microscope (SEM).
通过酸溶、X射线衍射、红外光谱和扫描电镜等手段分析了粉煤灰石灰蒸压系统中水化产物的变化。
The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).
通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。
The X-ray diffraction (XRD), excitation, emission and phonon side band spectra of the upper and lower parts of crystals were measured.
测定了晶体下部与上部的X射线衍射图（XRD）、激发光谱、荧光光谱以及声子边带谱。
Transmission electron microscope (TEM), Raman spectroscopy and X ray diffraction (XRD) were used to investigate the lattice structures, phonon properties of the samples.
通过透射电境、X光衍射和拉曼散射对纳米晶的晶格结构和声子特性进行了研究。
Optical properties and adhesion of Ag films with Cr interlayer of different thickness on glass substrates were investigated by using spectrophotometer and X-ray diffraction (XRD).
研究了在玻璃基底上采用不同厚度的铬膜作过渡层，对银膜的光学性质及其附着力的影响。
Gel permeation chromatography (GPC), Fourier transform infrared spectrometer (FT-IR), X-ray diffraction (XRD) were adopted to characterize and analyze the degraded products.
用凝胶渗透色谱(GPC)、傅立叶变换红外光谱(FT - IR)和X射线衍射(XRD)对降解产物进行表征分析。
The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).
通过X射线粉末衍射（XRD）和扫描电子显微镜（SEM）对产物进行了表征。
Phase identification was performed by X-ray diffractometry (XRD).
薄膜的物相由X射线衍射(XRD)确定。
The structural change of PAN based carbon fibre by an electric current pulse was studied by means of X-ray diffraction(XRD) and transmission electron microscopy(TEM).
用X射线衍射（XRD）、透射电子显微镜（TEM）等技术研究了PAN基碳纤维在单电流脉冲作用下的结构变化。
Structures and properties of these materials were studied by X-ray diffraction (XRD) analysis, scanning electronic microscopy (SEM) observation and differential scanning calorimetry (DSC) analysis.
并采用X—射线衍射分析、扫描电镜和差热差重分析，研究了复合蓄热材料的性能和结构。
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
Composition of inorganic phases and order degree of lamellar structure were characterized by X-ray diffraction (XRD).
用XRD表征了合成产物的无机相组成和层状结构的有序度。
The surface profiles, micro-morphologies and crystal quality of SSP ribbon and Poly-Si film were then investigated by the step profiler, XRD (X-ray Diffraction) and SEM (Scanning Electron Microscopy).
借助台阶仪、X射线衍射(XRD)、扫描电镜(sem)等手段对颗粒硅带及多晶硅薄膜进行了表面轮廓、结晶质量和微观形貌的表征。
The microstructure? Element distribution and phase after hot-corrosion were analysed by means of X-ray diffraction (XRD) and scanning electron microscope (SEM).
利用X射线衍射(XRD)和扫描电镜(sem)等手段，对高温熔盐热腐蚀后的组织形貌、元素分布及物相进行了分析。
In addition, the microstructure of the MgO thin films were examined with X-ray diffraction (XRD), Atomic Force Morphology (AFM) and Transmission Electron Micrograph (TEM).
同时，用X射线衍射(XRD)、原子力显微电镜(afm)和透射电镜(TEM)对薄膜的微观结构进行了分析。
They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).
对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。
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