First of all, several methods about testing technology and design for testability and SoC test techniques are summarized.
首先对测试技术和可测试性设计的一些方法做出了综述。
This paper introduces the special software and flow converted from VCD test vector to STIL test vector, which is based of SAPPHIRE SOC test System.
本文基于SAPPHIRE集成电路测试系统，介绍了自行开发的从VCD测试向量到STIL测试向量的转换软件及流程。
The paper proposed a new Selected Variable-length Input Coding (SVIC) for System on Chip (SOC) test data compression.
本文针对SOC测试数据压缩，提出了一种新的可挑选变长输入编码(SVIC)方案。
A deterministic algorithm is proposed for System-on-Chip (SOC) test scheduling.
提出了一种确定性的片上系统(SOC)测试调度算法。
A deterministic algorithm is proposed for System-on-Chip (SOC) test scheduling.
提出了一种确定性的片上系统(SOC)测试调度算法。
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