The second problem of test reuse is the design of SOC test architecture.

测试复用的第二个问题就是SOC测试结构设计问题。

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First of all, several methods about testing technology and design for testability and SoC test techniques are summarized.

首先对测试技术和可测试性设计的一些方法做出了综述。

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This paper introduces the special software and flow converted from VCD test vector to STIL test vector, which is based of SAPPHIRE SOC test System.

本文基于SAPPHIRE集成电路测试系统，介绍了自行开发的从VCD测试向量到STIL测试向量的转换软件及流程。

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