And initial results have been obtained in the field of the application of combining microelectronic test structure with quality control theory to semiconductor technology.
将微电子测试结构与质量管理理论结合起来，运用于半导体技术，取得了初步结果。
And initial results have been obtained in the field of the application of combining microelectronic test structure with quality control theory to semiconductor technology.
将微电子测试结构与质量管理理论结合起来，运用于半导体技术，取得了初步结果。
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