And initial results have been obtained in the field of the application of combining microelectronic test structure with quality control theory to semiconductor technology.
将微电子测试结构与质量管理理论结合起来，运用于半导体技术，取得了初步结果。
Test of memory faces enormous challenge because of the semiconductor technology progress.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
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