The line width of nanostructures is influenced by many factors such as tip curvature radius, detained time in the base surface, scanning speed, humidity, surface roughness etc.
尖端曲率半径、针尖在基底表面滞留时间、针尖扫描速度、空气湿度、表面粗糙度等均会影响纳米结构的线宽。
The line width of nanostructures is influenced by many factors such as tip curvature radius, detained time in the base surface, scanning speed, humidity, surface roughness etc.
尖端曲率半径、针尖在基底表面滞留时间、针尖扫描速度、空气湿度、表面粗糙度等均会影响纳米结构的线宽。
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