A new optical interferometer suitable for using in the scanning force microscope is presented. The cantilever itself is used as a micro interferometer element.
目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
The force and temperature of polycrystalline diamond grinding with diamond wheel are tested and analyzed, the machined surface is investigated with scanning electron microscope.
首先对金刚石砂轮磨削加工聚晶金刚石的磨削力和磨削温度进行了测试和分析，利用扫描电镜对工件加工表面进行了微观分析研究。
Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
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