TEMs work by firing a beam of electrons through the material and measuring how it absorbs and deflects the particles to build up an image of the sample.
TEMs 的工作原理是通过发射一束电子穿过某种物质，并测量它如何吸收和偏转粒子来建立样本的图像。
This photomicrograph was obtained by scanning a beam of electrons across the sample while a detector kept track of electrons bouncing off its surface, betraying the specimen's outer shape.
这幅显微照片是通过扫描穿过样品的电子束而获得的，同时检测器对从样品表面反弹的电子进行追踪，这些电子显示了标本的外形。
Then they brought the sample back to room temperature and exposed it to an X-ray beam from the facility while using a CCD detector to record the X-rays reflected from the surface of the sample.
然后他们将样品重置于室温状态，并使其接受X射线照射，同时使用CCD检测器来记录从样品表面反射回的X射线。
The researchers then narrowed down the X-ray beam so that it was just a tenth of a millimetre across and found that the fractal-like regions occurred only where the beam struck the sample.
研究人员随后将X射线的光束收窄，使其只有十分之一毫米宽，这时他们发现，碎片形的区域只出现在射线照射的地方。
The nanoprobe excites the sample with a strongly focused X-ray beam and collects the characteristic fluorescence signal that is re-emitted.
纳米探针通过聚焦强X射线激发样品，然后收集发射出的特征荧光。
That displacement is measured with a laser beam to create a series of 2-d images of the sample, which are combined to generate a 3-d image.
然后用一束激光来测量这个摆动的位移，并由此生成一系列此样本的二维影像，再由这个生成其三维影像。
A new type of optical storing material, the film sample of azobenzene disperse red polymer is measured by using the single beam Z-scan technique.
采用单光束Z扫描技术对新型光学存储材料偶氮分散红聚合物的薄膜样品进行了测量。
With the 4W1A beam at Beijing SR Facility (BSRF), the diffraction enhanced imaging(DEI)was applied to image sample tissues of liver and kidney. Results were compared with pathological findings.
在北京同步辐射装置（BSRF）的4W1A束线上，使用衍射增强技术（DEI）对肝、肾等组织进行成像，部分结果与病理结果进行对照；
The sample should not be so large as to increase unduly the width of the diffracted beam.
样品不应当过分大，以致不恰当地增加了衍射束的宽度。
In this paper, a novel approach of doubly robust adaptive beam formation (RABF) is proposed in order to improve the robustness against finite-sample effects and steering vector errors.
提出了一种具有双重鲁棒性的自适应波束形成算法，以克服有限采样效应和方向矢量误差引起的波束性能下降。
Sample warping is a new warp method which using single yarn to form warp beam, and it's the special equipment to weave sample or produce fabric in small quantity.
样品整经是一种全新的整经方法，用单根经纱即可形成织轴，是用于织造样品及小批量织物进行整经的专用设备。
Switches between sample and reference beam. Four-segment design provides individual blank readings for sample and reference, increasing measurement accuracy.
斩波器，将光依次切换到参比光路和样品光路，四扇区设计可以提供样品测试和参比测试中分别测试暗电流，增加准确性。
A sample was fabricated through electron beam evaporation technique, and its optical performance absolutely satisfied the requirements.
最后利用电子束蒸发技术制备了薄膜样品，样品的光谱性能完全能够满足使用要求。
The charging equilibration time constant decreases with the beam intensity and the thickness of the sample. The surface voltage decays slowly when the electron beam is cut off.
在一定条件下，样品表面电位随着辐照电子束流密度和样品厚度的增加而增大；
Based on the photoelectric effect, when a beam of monochromatized radiation is shined on a sample, electrons are emitted and escape to the vacuum (Fig. 1).
利用光电效应的原理，我们用深紫外光照射样品，并探测出射的光电子（图一）。
To resolve the problems of inaccurate control of sizing speed, dry can temperature and beam winding tension of JSSJ-83 sample sizing machine, innovation of it was done.
为解决JSSJ- 83型小样浆纱机浆纱速度、烘燥温度、织轴卷绕张力控制不准确的问题，进行了技术改造。
Through the simulation of a cantilever beam in different damage cases, We get the corresponding natural frequencies (samples) and make up the sample aggregate.
利用悬臂梁的仿真分析，获得各种典型损伤工况下的结构固有频率(样本)，组成学习问题的样本集。
As the simplest shaping pulse double pulse produced by a beam splitter is first used to ablate the sample.
使用分束片获得的双脉冲作为最简单的整形脉冲，首先被用来烧蚀样品。
Based on ASTF the influence of such parameters as tip-sample distance, tip aperture diameter and the incident Angle of illuminating laser beam on PSTM image has been discussed.
进一步根据角谱传递函数计算了不同样品的光子扫描隧道显微镜理论图像，分析了探针与样品的间距、探针孔径大小、照明光入射角等对光子扫描隧道显微镜成像的影响。
This sample holder is placed at 25" to the X-ray beam and rotated at a rate of 1 rpm to avoid preferential orientation effects."
本样品储存器在X射线中放置25 秒，旋转的速度为每分钟1圈，以避免择优取向的影响。
A hidden danger in the high voltage power supply of the ELA-120/6 electron beam welding machine is found, countermeasures to remove the danger are discussed and an ameliorated sample is made.
分析了EAL-120/6型电子束焊机高压电源存在的安全隐患，提出了消除隐患的措施，给出一种改进实例。
A hidden danger in the high voltage power supply of the ELA-120/6 electron beam welding machine is found, countermeasures to remove the danger are discussed and an ameliorated sample is made.
分析了EAL-120/6型电子束焊机高压电源存在的安全隐患，提出了消除隐患的措施，给出一种改进实例。
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