sample light beam 试样光束
TEMs work by firing a beam of electrons through the material and measuring how it absorbs and deflects the particles to build up an image of the sample.
TEMs 的工作原理是通过发射一束电子穿过某种物质，并测量它如何吸收和偏转粒子来建立样本的图像。
This photomicrograph was obtained by scanning a beam of electrons across the sample while a detector kept track of electrons bouncing off its surface, betraying the specimen's outer shape.
这幅显微照片是通过扫描穿过样品的电子束而获得的，同时检测器对从样品表面反弹的电子进行追踪，这些电子显示了标本的外形。
Then they brought the sample back to room temperature and exposed it to an X-ray beam from the facility while using a CCD detector to record the X-rays reflected from the surface of the sample.
然后他们将样品重置于室温状态，并使其接受X射线照射，同时使用CCD检测器来记录从样品表面反射回的X射线。
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