The problem of embedded memory fault repair is becoming increasingly important with the growing fault rate of SOC.

随着SOC芯片故障概率的增加，嵌入式存储器的修复变得越来越重要。

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A large number of various embedded memory are integrated in digital chips, as the constraints of chip ports, direct test of these memories is very difficult.

各种类型的嵌入式存储器大量集成于数字芯片中，由于芯片端口的限制，直接测试这些存储器非常困难。

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With the increasing demand for large data throughput and the requirement of lower system power consumption, the embedded memory demand is increasing rapidly.

随着数据吞吐量不断上升以及系统低功耗要求，系统级芯片对存储器的需求越来越大。

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With the increasing demand for large data throughput and the requirement of lower system power consumption, the embedded memory demand is increasing rapidly.

随着数据吞吐量不断上升以及系统低功耗要求，系统级芯片对存储器的需求越来越大。

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