The problem of embedded memory fault repair is becoming increasingly important with the growing fault rate of SOC.
随着SOC芯片故障概率的增加,嵌入式存储器的修复变得越来越重要。
A large number of various embedded memory are integrated in digital chips, as the constraints of chip ports, direct test of these memories is very difficult.
各种类型的嵌入式存储器大量集成于数字芯片中,由于芯片端口的限制,直接测试这些存储器非常困难。
With the increasing demand for large data throughput and the requirement of lower system power consumption, the embedded memory demand is increasing rapidly.
随着数据吞吐量不断上升以及系统低功耗要求,系统级芯片对存储器的需求越来越大。
With the increasing demand for large data throughput and the requirement of lower system power consumption, the embedded memory demand is increasing rapidly.
随着数据吞吐量不断上升以及系统低功耗要求,系统级芯片对存储器的需求越来越大。
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