Based on the double bridge structure of microelectronics test pattern, the method of defect model parameter extraction is presented in this paper.
基于微电子测试双桥结构，本文给出了缺陷特征参数提取方法。
This paper studies the fault classification and diagnosis method of the double-bridge 12-pulse waveform controlled rectifier circuit based on pattern recognition.
研究了一种双桥并联可控整流电路的故障分类及诊断方法。
This paper studies the fault classification and diagnosis method of the double-bridge 12-pulse waveform controlled rectifier circuit based on pattern recognition.
研究了一种双桥并联可控整流电路的故障分类及诊断方法。
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