The piezoelectric scanner is one of the key components of scanning probe microscope.
三维压电陶瓷扫描器是扫描探针显微镜的关键部件。
A general trend of Scanning Probe Microscope (SPM) is to multiple functionality and digitalization.
扫描探针显微镜(SPM)当前的发展趋势是功能复合化和数字化。
The influence of external vibration on scanned images of scanning probe microscope (SPM) is discussed.
探讨了外界激振对扫描探针显微镜(SPM)扫描图像的影响。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
A calibration method for the non-linearity of the Scanning Probe Microscope (SPM) "s PZT scanner was described."
针对扫描探针显微镜的压电扫描器提出一种非线性校正方法。
Up to now the imported commercial scanning probe microscope (SPM) has not an automatic error correcting and reducing system.
目前，我国引进的一般商业性的SPM(扫描探针显微镜)中缺少误差的自动修正和改进系统。
Nanofabrication in electrical field by Scanning Probe Microscope (SPM) can fabricate electrical devices and mechanical structures in nanometer scale.
利用扫描探针显微镜(SPM)能够实现纳米级电子器件和机械器件的加工。
Scanning probe microscope (SPM) is used not only for measuring the micro profiles of surfaces, but also for nano ultraprecise machining and atom manipulation now.
扫描探针显微镜(SPM)现在不仅用于表面微观形貌的检测，同时也用于纳米超精密加工和原子操纵。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
The scanning probe microscope is one of the most important developments on observing and determining surface topography and surface properties in near ten years and is basic tool of nano-measurement.
扫描探针显微镜是近十几年来在表面特征、表面形貌观测方面最重大的进展之一，是纳米测量学的基本工具。
Scanning tunneling microscope (STM) work by the voltage added to the microscope probe tip and the ends of the scanned object and then detect current changes.
扫描隧道显微镜(STM)的工作方式是把电压加到显微镜探头尖端与被扫描物体这两端，然后检测电流变化。
Near Field Optical Microscope (NFOM) is a kind of scanning probe microscopy with high resolution.
近场光显微镜(NFOM)是一种高分辩率的扫描探针显微镜。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Analysis is made on the dark lines defects occurring over the working surface of flange by measurement with the optical microscope, Scanning electro microscope (SEM) and electronic probe.
针对法兰盘加工面上出现的黑纹缺陷，采用光学显微镜、扫描电镜和电子探针等测试方法对其进行了分析。
The work establish the foundation for fabricating good probe experimentally and extending the application of scanning near field optical microscope (SNOM).
这为实验上制备出性能优良的探针，为拓宽扫描近场光学显微镜的应用范围奠定基础。
The cross section morphology and skin-core structure of PAN fiber in wet-spinning are analyzed by the means of electron probe microanalyser (EPMA) and scanning electron microscope (SEM).
利用电子探针、扫描电镜研究了聚丙烯腈在湿法纺丝工艺中的横截面形貌与皮芯结构。
Reviewed are the basic principles and application fields of probe-based imaging microscope, represented by scanning tunneling microscopes for the recent 20 years.
综述了近二十年来以扫描隧道显微镜为代表的、基于探针的成像显微装置基本原理及应用领域。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
The cross section morphology and skin-core structure of PAN fiber in wet-spinning are analyzed by the means of electron probe microanalyser (EPMA) and scanning electron microscope (SEM).
结果表明凝固浴温度会影响初生纤维的横截面形貌与芯部结构。
The cross section morphology and skin-core structure of PAN fiber in wet-spinning are analyzed by the means of electron probe microanalyser (EPMA) and scanning electron microscope (SEM).
结果表明凝固浴温度会影响初生纤维的横截面形貌与芯部结构。
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