Design for test is an important process in the chip design nowadays, testability design of wireless chip needs a much higher requirement of test technology.
可测试性设计是现代芯片设计中的关键环节，针对无线接入芯片的可测试性设计对测试技术有更高的要求。
Besides, it is discovered that there are some merits for error signature analysis and testability design when binary counting sequences are used as the testing input.
此外，发现用二进计数序列作为测试输入对于差错特征量可测试性设计有一定优点。
This paper presents the important action of the simulation fault injection in the testability design, and the important steps to complete the testability design using the simulation.
论述了仿真故障注入在测试性设计中的重要作用以及利用仿真进行测试性设计的几个重要环节。
Hopefully, the project that I'm currently working on (Google Android) is solving some of these problems and we did our best to make testability and sane design at the forefront of our thoughts.
我希望，我所工作的这个项目(GoogleAndroid)能够解决这些问题，我们尽了最大的努力来将可测试化和健全明智的设计置于首位。
Prospective users should also look at the actual architecture emitted and critically review it for testability, maintainability, design integrity, duplication, lock-in avoidance etc.
用户还可能会审视实际的架构、仔细审阅其可测试性、可维护性、设计完整性、可复制性、避免独占等等。
As an added benefit, they can also increase testability when combined with proper GUI design patterns.
附带的好处是这些数据绑定框架在与适当的GUI设计模式结合使用时能够提高可测试性。
Writing aspects to be testable yields design benefits parallel to those achieved by factoring object-oriented code for testability.
将方面编写为可测试的，得到的设计好处与通过重构面向对象的代码来实现可测试性所得到的好处相似。
First of all, several methods about testing technology and design for testability and SoC test techniques are summarized.
首先对测试技术和可测试性设计的一些方法做出了综述。
As the scale of IC is increasing, its testability must be taken into account in the course of circuit design and the testability measure of circuits should be determined.
集成电路规模的增加，使电路的可测试性成了设计阶段必须考虑的问题，这就需要预先确定电路中各部份的测试性能。
This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability.
本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。
An optimal sequencing of the storage elements in the single scan chain design for - testability is presented in the paper.
本文提出了扫描设计中存储元件在扫描链中的最优排序方法。
In this paper, a VLSI implementation method of design-for-testability for DCT is presented.
本文提出了一种离散余弦变换电路VLSI实现的可测试性设计。
In this paper, from the point of view of the design for testability, we discussed the necessary of the test synthesis technology, and also discussed the methods and steps of the test synthesis.
本文从可测试性设计的角度出发，讨论了测试综合技术的必要性，以及测试综合的方法与步骤。
Moreover, power and testability issue of the design are also considered.
此外，电路的消耗功率和可测试性也是我们设计上的考虑重点。
If necessary, our technicians can cooperate with you to design the product, in order to transfer and apply the concepts of the design for testability.
如有必要，我们的技术人员可以和您合作，共同设计开发产品，以便转换和应用测试设计理念。
Design by contract is an important approach to design for testability of software.
合约式设计是一种重要的软件易测试性设计方法。
In this paper, a knowledge-based design for testability (DFT), is presented.
本文提出了一种基于知识的可测试性设计(DFT)方法。
Considering power optimization in design for testability of system-on-a-chip is a newly emerging research region.
在系统芯片可测试性设计中考虑功耗优化问题是当前国际上新出现的研究领域。
This paper discusses the feature and factors of software testability, and the method how to improve the design of software testability.
该文讨论了软件可测试性的特征和影响软件测试的因素，以及改进软件可测试性设计的几种方法。
Aid decision making tool is the key technology for improving the level of design for testability of equipment.
针对测试性设计的辅助决策工具是装备测试性设计水平提高的关键技术。
There are some common methods of design for testability, such as boundary scan test and so on.
目前常见的可测试性设计方法主要有改善设计法、结构设计法和边界扫描测试法等几种。
The first step of design for testability(DFT) is to determine the testability index.
合理地提出系统测试性指标是测试性设计的首要步骤。
On the basis of design for testability in airborne computer principle and testability classification, design technique of testability in different test hiberarchy is presented.
本文在介绍机载计算机的可测试性设计原理和测试分类的基础上，提出了在不同的测试级别上的可测试性工程设计技术。
Design for testability of CSC71018, an application-specific IC for programmable switchboard with top-down design, is introduced in the paper.
本文介绍了正向设计的局用万门程控交换机专用集成电路CSC71018的可测性设计。
In this paper, design technologies of sub-micron CMOS gate array, such as building library, testability, clock design, power-ground design, architecture optimizing, margin design, are presented.
本文主要论述亚微米cmos门阵列的设计技术，包括建库技术，可测性设计技术、时钟设计技术、电源、地设计技术、电路结构优化、余量设计技术等，最后给出了应用实例。
To reduce the difficulty of electronic system testing, testability need to be considered in system design stage and included into design standards.
为了降低电子系统的测试难度，需要在系统设计阶段就开始考虑可测性问题，将其纳入设计规范。
Reducing the power consumption in design for testability is a new research field in the academic and industrial circles.
降低测试期间的功耗是当前学术界和工业界新出现的一个研究领域。
Reducing the power consumption in design for testability is a new research field in the academic and industrial circles.
降低测试期间的功耗是当前学术界和工业界新出现的一个研究领域。
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