Design for test is an important process in the chip design nowadays, testability design of wireless chip needs a much higher requirement of test technology.
可测试性设计是现代芯片设计中的关键环节,针对无线接入芯片的可测试性设计对测试技术有更高的要求。
This paper presents the important action of the simulation fault injection in the testability design, and the important steps to complete the testability design using the simulation.
论述了仿真故障注入在测试性设计中的重要作用以及利用仿真进行测试性设计的几个重要环节。
This paper presents the important action of the simulation fault injection in the testability design, and the important steps to complete the testability design using the simulation.
论述了仿真故障注入在测试性设计中的重要作用以及利用仿真进行测试性设计的几个重要环节。
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