The resistance of the metal probe to semiconductor contact can be quite high.
金属探头与半导体接触时的电阻可能相当高。
In this paper, a probe of vacuum microbalance to monitor and measure for high accuracy of film thickness is introduced, thermostatic probe of the semiconductor refrigeration device.
本文研制了一种用于高精度膜厚监测的真空微量天平探头：半导体致冷器件恒温探头。
Probe card, method of designing the probe card, and method of testing semiconductor chips using the probe card.
探针卡，该探针卡的设计方法，以及使用该探针卡测试半导体芯片的方法。
Purpose: Quantum Dots (semiconductor nanocrystal) which are used in biophotonics as a novel fluorescent probe have attracted a lot of scientific research staffs attention all around the world.
前言：目的：量子点(半导体纳米微晶体)作为一种新型荧光探针应用到生物光子学中已经引起了国内外科学工作者的极大关注。
By using the adsorption of gas probe, we can understand the surface or interface electron character of functional semiconductor in micro-nano region in essentially from a new point of view.
揭示了半导体表面微钠区城原子结构对其微纳区域表面和界面电子特性的影响，为认识半导体微纳区域表面和界面电子行为提供了新思路。
Moreover, in order to clean the semiconductor test probe, the probe module group as a whole, due to the special structure of the tail part of the probe, can be placed into an ultrasonic cleaner.
而且如果使用本半导体测试探针，由于针尾部的特殊结构，我们可以将整个针模组放入超声波清洗机中清洗。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.
本实用新型涉及一种半导体测试器件，尤其是半导体测试探针。
As a new biological probe, fluorescent semiconductor quantum dots have brought profound changes of research methods and means in the field of biomedicine.
半导体荧光量子点作为一种新型的生物荧光标记物，已经引起了生物医学领域研究方法和手段的深刻变革。
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.
本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
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