A new optical interferometer suitable for using in the scanning force microscope is presented. The cantilever itself is used as a micro interferometer element.
目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。
In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
It is demonstrated that the detection sensitivity can be greatly improved, and the resolution of SFM (scanning force microscopy) image can reach nanometer order of magnitude.
实验结果表明，检测灵敏度大大提高，扫描力显微(SFM)像的分辨率可达纳米量级。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.
原子力显微镜扫描对醛基化玻片表面形貌进行分析。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). Transmission electron microscopy (TEM) and atom force microscopy (AFM).
并用扫描电子显微镜(sem)、透射电子显微镜(TEM)和原子力显微镜(afm)对阳极氧化铝膜的形貌和结构进行了表征。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
The force and temperature of polycrystalline diamond grinding with diamond wheel are tested and analyzed, the machined surface is investigated with scanning electron microscope.
首先对金刚石砂轮磨削加工聚晶金刚石的磨削力和磨削温度进行了测试和分析，利用扫描电镜对工件加工表面进行了微观分析研究。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
After thoroughly studying the MEM process, the frequency range of inertia force, which is caused by the scanning movement of extrusion head, has been found.
本文在深入分析MEM工艺过程之后，找出喷头扫描运动产生的惯性力的频率范围。
Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
The surface composition and structure of membrane were characterized by Fourier transform infrared spectroscopy, scanning electronic microscopy and atomic force microscopy.
红外光谱仪对所制备膜的化学组成进行表征。
The surface composition and structure of membrane were characterized by Fourier transform infrared spectroscopy, scanning electronic microscopy and atomic force microscopy.
红外光谱仪对所制备膜的化学组成进行表征。
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