The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
The atomization mechanism of europium nitrate on graphite probe surface in graphite furnace was investigated experimentally by X-ray diffraction spectrometry and X-ray photoelectron spectrometry.
用x -射线衍射分析与X -射线光电子能谱分析研究了硝酸铕在石墨炉内石墨探针表面原子化机理。
The interaction between the cerium and tin in steel was studied by vacuum induction melting, Xray diffraction, optical microscopy, electronic probe microscopy analysis, and microhardness tester.
采用中频真空感应熔炼炉、X射线衍射仪、金相显微镜、电子探针、显微硬度计等实验分析方法，研究了稀土金属铈与低熔点金属锡在钢中的相互作用。
The cantilever itself can be used as a point diffraction interferometer element, and a new optical interference probe based on this is set up to measure the deflection or amplitude of the cantilever.
发现了由于V形微探针的结构特点而引起的点衍射干涉现象，并据此构成了一种基于点衍射干涉的微探针振幅测量的干涉光探针，这种干涉光探针在国内外至今未见相同的报导。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
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